• JEDEC JESD 381-A (R2002)

JEDEC JESD 381-A (R2002)

  • METHOD OF DIODE Q MEASUREMENT
  • standard by JEDEC Solid State Technology Association, 11/01/1981
  • Category: JEDEC

$60.00 $30.00

This standard was updated and revised for the purpose of clarifying the method used to measure Q of a Voltage-Variable-Capacitance Diode in the low VHF range using an RF admittance bridge. Originally published November 1981. Approved as ANSI/EIA-381-A-1992, July 1992. Became JESD381-A after ANSI expiration July 2002.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD 36

JEDEC JESD 36

STANDARD DESCRIPTION OF LOW-VOLTAGE TTL-COMPATIBLE, 5 V TOLERANT CMOS LOGIC DEVICES..

$28.00 $56.00

JEDEC JESD32

JEDEC JESD32

STANDARD FOR CHAIN DESCRIPTION FILE..

$30.00 $59.00

JEDEC JEP103A (R2003)

JEDEC JEP103A (R2003)

SUGGESTED PRODUCT-DOCUMENTATION, CLASSIFICATIONS, AND DISCLAIMERS..

$24.00 $48.00

JEDEC EIA 318-B

JEDEC EIA 318-B

MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES..

$30.00 $59.00