• JEDEC JEP160

JEDEC JEP160

  • Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devices
  • standard by JEDEC Solid State Technology Association, 11/01/2011
  • Category: JEDEC

$67.00 $34.00

This publication examines the LTS requirements of wafers, dice, and packaged solid-state devices. The user should evaluate and choose the best practices to ensure their product will maintain as-received device integrity and minimize age- and storage-related degradation effects.
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JEDEC JESD67

JEDEC JESD67

I/O DRIVERS AND RECEIVERS WITH CONFIGURABLE COMMUNICATION VOLTAGE, IMPEDANCE, AND RECEIVER THRESHOLD..

$28.00 $56.00

JEDEC JESD51-5

JEDEC JESD51-5

EXTENSION OF THERMAL TEST BOARD STANDARDS FOR PACKAGES WITH DIRECT THERMAL ATTACHMENT MECHANISMS..

$24.00 $48.00

JEDEC JESD51-6

JEDEC JESD51-6

INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS - FORCED CONVECTION (MOVING AIR)..

$24.00 $48.00

JEDEC JEP113-B

JEDEC JEP113-B

SYMBOL AND LABELS FOR MOISTURE-SENSITIVE DEVICES..

$90.00 $180.00