JEDEC JESD311-A (R2009)
- MEASUREMENT OF TRANSISTOR NOISE FIGURE AT MF, HF, AND VHF
- standard by JEDEC Solid State Technology Association, 11/01/1981
- Category: JEDEC
$60.00
$30.00
This standard describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. This standard also adds the necessary information to make 'effective input noise temperature measurements'. This method is a revision of EIA-311 and incorporates material previously found in EIA-283. Formerly known as RS-311A and/or EIA-311-A.
PDF
All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.
Multi-User Access
After purchasing, you have the ability to assign each license to a specific user.
Printable
At any time, you are permitted to make printed copies for your and your members' reference use.
