JEDEC JS-002-2014
- ANSI/ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing, Charged Device MOdel (CDM) - Device Level
- standard by JEDEC Solid State Technology Association, 04/07/2015
- Category: JEDEC
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This standard establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto-electronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this standard. This test method combines the main features of JEDEC JESD22-C101 and ANSI/ESD S5.3.1.
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