• JEDEC JEP114.01

JEDEC JEP114.01

  • GUIDELINES FOR PARTICLE IMPACT NOISE DETECTION (PIND) TESTING, OPERATOR TRAINING, AND CERTIFICATION
  • standard by JEDEC Solid State Technology Association, 10/01/2007
  • Category: JEDEC

$78.00 $39.00

This publication was developed to help the user of this test methodology avoid common interference to successful application. The guide contains sections on typical specification requirements, sources of particles, PIND test systems, calibration, maintenance, test interference's, operator training, particle recovery and failure analysis. Application of the information contained in the guide will improve the quality and affectivity for any PIND testing operation.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JEP709

JEDEC JEP709

A Guideline for Defining "Low-Halogen" Solid State Devices (Removal of BFR/CFR/PVC)..

$27.00 $54.00

JEDEC JESD51-14

JEDEC JESD51-14

INTERFACE TEST METHOD FOR THE MEASUREMENT OF THE THERMAL RESISTANCE JUNCTION-TO-CASE OF SEMICONDUCTO..

$40.00 $80.00

JEDEC JESD51-32

JEDEC JESD51-32

THERMAL TEST BOARD STANDARDS TO ACCOMMODATE MULTI-CHIP PACKAGES..

$26.00 $51.00

JEDEC JESD 209-2D

JEDEC JESD 209-2D

LOW POWER DOUBLE DATA RATE 2 (LPDDR2)..

$153.00 $305.00