• JEDEC JEP114.01

JEDEC JEP114.01

  • GUIDELINES FOR PARTICLE IMPACT NOISE DETECTION (PIND) TESTING, OPERATOR TRAINING, AND CERTIFICATION
  • standard by JEDEC Solid State Technology Association, 10/01/2007
  • Category: JEDEC

$78.00 $39.00

This publication was developed to help the user of this test methodology avoid common interference to successful application. The guide contains sections on typical specification requirements, sources of particles, PIND test systems, calibration, maintenance, test interference's, operator training, particle recovery and failure analysis. Application of the information contained in the guide will improve the quality and affectivity for any PIND testing operation.
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JEDEC JESD69C

JEDEC JESD69C

INFORMATION REQUIREMENTS FOR THE QUALIFICATION OF SILICON DEVICES..

$27.00 $54.00

JEDEC JESD16B

JEDEC JESD16B

ASSESSMENT OF AVERAGE OUTGOING QUALITY LEVELS IN PARTS PER MILLION (PPM)..

$39.00 $78.00

JEDEC JESD204C

JEDEC JESD204C

Serial Interface for Data Converters..

$153.00 $305.00

JEDEC JESD50C

JEDEC JESD50C

SPECIAL REQUIREMENTS FOR MAVERICK PRODUCT ELIMINATION AND OUTLIER MANAGEMENT..

$30.00 $60.00