• JEDEC EIA 318-B

JEDEC EIA 318-B

  • MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES
  • standard by JEDEC Solid State Technology Association, 07/01/1996
  • Category: JEDEC

$59.00 $30.00

This standard describes the measurement of signal diodes (IF <=500mA dc) reverse recovery times of less than 300 ns duration. It may, however, also be used for the measurement of longer recovery times. This standard is also intended to establish a method which to characterize the test fixture used for this measurement.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JEP174

JEDEC JEP174

UNDERSTANDING ELECTRICAL OVERSTRESS - EOS..

$104.00 $208.00

JEDEC JESD22-B103B.01

JEDEC JESD22-B103B.01

VIBRATION, VARIABLE FREQUENCY..

$28.00 $56.00

JEDEC JESD248

JEDEC JESD248

DDR4 NVDIMM-N Design Standard..

$44.00 $87.00

JEDEC JEP122H

JEDEC JEP122H

Failure Mechanisms and Models for Semiconductor Devices..

$82.00 $163.00