• JEDEC JEP174

JEDEC JEP174

  • UNDERSTANDING ELECTRICAL OVERSTRESS - EOS
  • standard by JEDEC Solid State Technology Association, 09/01/2016
  • Category: JEDEC

$208.00 $104.00

The purpose of this white paper will be to introduce a new perspective about EOS to the electronics industry. As failures exhibiting EOS damage are commonly experienced in the industry, and these severe overstress events are a factor in the damage of many products, the intent of the white paper is to clarify what EOS really is and how it can be mitigated once it is properly comprehended.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JS709C

JEDEC JS709C

Joint JEDEC/ECA Standard: Definition of "Low-Halogen" for Electronic Products..

$30.00 $60.00

JEDEC JESD72A

JEDEC JESD72A

TEST METHODS AND ACCEPTANCE PROCEDURES FOR THE EVALUATION OF POLYMERIC MATERIALS..

$37.00 $74.00

JEDEC JESD8-21B

JEDEC JESD8-21B

POD135 - 1.35 V PSEUDO OPEN DRAIN I/O..

$34.00 $67.00

JEDEC JESD248A

JEDEC JESD248A

DDR4 NVDIMM-N Design Standard..

$40.00 $80.00