JEDEC JESD47I.01
- STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
- standard by JEDEC Solid State Technology Association, 10/01/2016
- Category: JEDEC
$72.00
$36.00
This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed. This is a minor editorial revision to JESD47I, published December 2015.
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