• JEDEC JESD224A

JEDEC JESD224A

  • Universal Flash Storage (UFS) Test
  • standard by JEDEC Solid State Technology Association, 07/01/2017
  • Category: JEDEC

$305.00 $153.00

The primary objective of this test standard is to specify the test cases for UFS device protocolconformance testing. This test standard provides test cases for checking the functions defined in thefollowing target standard:
JESD220, Universal Flash Storage (UFS) Standard version 1.1A
MIPI M-PHY and MIPI UniPro test cases are not in the scope of this document.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JEP 122F

JEDEC JEP 122F

FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES..

$71.00 $141.00

JEDEC JEP709

JEDEC JEP709

A Guideline for Defining "Low-Halogen" Solid State Devices (Removal of BFR/CFR/PVC)..

$27.00 $54.00

JEDEC JESD51-14

JEDEC JESD51-14

INTERFACE TEST METHOD FOR THE MEASUREMENT OF THE THERMAL RESISTANCE JUNCTION-TO-CASE OF SEMICONDUCTO..

$40.00 $80.00

JEDEC JESD51-32

JEDEC JESD51-32

THERMAL TEST BOARD STANDARDS TO ACCOMMODATE MULTI-CHIP PACKAGES..

$26.00 $51.00