• JEDEC JESD221

JEDEC JESD221

  • Alpha Radiation Measurement in Electronic Materials
  • standard by JEDEC Solid State Technology Association, 05/01/2011
  • Category: JEDEC

$74.00 $37.00

The purpose of this document is to specify the recommended method for measuring alphaemissivity in materials utilized in the manufacturing of semiconductors. The method specificallyapplies to gas proportional instruments and designates recommended instrument settings. Inaddition, the method discusses operation of ionization counters. The document also recommendsmethods for determining sample size and for evaluating instrument background accurately.Treatment of data is also outlined, including identification and elimination of systematic errors.The calculation of results and detection limits is detailed with examples in the annexes. Astandard format for reporting results is specified.
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JEDEC JESD220C

JEDEC JESD220C

Universal Flash Storage (UFS)..

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JEDEC JESD220-2

JEDEC JESD220-2

UNIVERSAL FLASH STORAGE (UFS) CARD EXTENSION..

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JEDEC JESD243

JEDEC JESD243

COUNTERFEIT ELECTRONIC PARTS: NON-PROLIFERATION FOR MANUFACTURERS..

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JEDEC JESD78E

JEDEC JESD78E

IC LATCH-UP TEST..

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