• JEDEC JESD47H

JEDEC JESD47H

  • STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
  • standard by JEDEC Solid State Technology Association, 02/01/2011
  • Category: JEDEC

$67.00 $34.00

This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD 12-2

JEDEC JESD 12-2

ADDENDUM No. 2 to JESD12 - STANDARD FOR CELL-BASED INTEGRATED CIRCUIT BENCHMARK SET..

$39.00 $78.00

JEDEC JESD 236-C (R2009)

JEDEC JESD 236-C (R2009)

COLOR CODING OF DISCRETE SEMICONDUCTOR DEVICES..

$26.00 $51.00

JEDEC JESD 12-3

JEDEC JESD 12-3

ADDENDUM No. 3 to JESD12 - CMOS GATE ARRAY MACROCELL STANDARD..

$30.00 $59.00

JEDEC JESD531 (R2002)

JEDEC JESD531 (R2002)

THERMAL RESISTANCE TEST METHOD FOR SIGNAL AND REGULATOR DIODES (FORWARD VOLTAGE, SWITCHING METHOD)..

$30.00 $59.00