• JEDEC JESD226

JEDEC JESD226

  • RF Biased Life (RFBL) Test Method
  • standard by JEDEC Solid State Technology Association, 01/01/2013
  • Category: JEDEC

$60.00 $30.00

This stress method is used to determine the effects of RF bias conditions and temperature on PowerAmplifier Modules (PAMs) over time. These conditions are intended to simulate the devices? operatingcondition in an accelerated way, and they are expected to be applied primarily for device qualification andreliability monitoring.
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