• JEDEC JESD22-A100-A

JEDEC JESD22-A100-A

  • Solid State Devices, Testing Quality and Reliability - Test Method A100: Cycled Temperature Humidity Bias Life Test
  • standard by JEDEC Solid State Technology Association, 01/01/1989
  • Category: JEDEC

$160.00 $80.00

PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JEP118

JEDEC JEP118

GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING..

$36.00 $72.00

JEDEC JESD209-5

JEDEC JESD209-5

Low Power Double Data Rate 5 (LPDDR5)..

$178.00 $355.00

JEDEC JESD8-33

JEDEC JESD8-33

.05 Low Voltage Swing Terminated Logic (LVSTL05)..

$10.00 $20.00

JEDEC JESD22-B110B.01

JEDEC JESD22-B110B.01

Mechanical Shock - Device and Subassembly..

$27.00 $54.00