• JEDEC JESD 22-B105C (R2006)

JEDEC JESD 22-B105C (R2006)

  • LEAD INTEGRITY
  • standard by JEDEC Solid State Technology Association, 05/01/2003
  • Category: JEDEC

$60.00 $30.00

This test method provides various tests for determining the integrity lead/package interface and the lead itself when the lead(s) are bent due to faulty board assembly followed by rework of the part for reassembly. For hermetic packages it is rececommend that this test be followed by hermeticity tests in accordance with Test Method A109 to determine if there are any adverse effects from the stresses applied to the seals as well as to the leads. These tests, including each of its test conditions, is considered destructive and is only recommended for qualification testing. This test is applicable to all through-hole devices and surface-mount devices requiring lead forming by the user.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD31D.01

JEDEC JESD31D.01

GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICES..

$34.00 $67.00

JEDEC JESD8-22A

JEDEC JESD8-22A

HSUL_12 LPDDR2 and LPDDR3 I/O with Optional ODT..

$39.00 $78.00

JEDEC JESD230A

JEDEC JESD230A

NAND Flash Interface Interoperability..

$37.00 $74.00

JEDEC JESD230

JEDEC JESD230

NAND Flash Interface Interoperability..

$37.00 $74.00