JEDEC JESD 22-A108C
- TEMPERATURE, BIAS, AND OPERATING LIFE
- standard by JEDEC Solid State Technology Association, 06/01/2005
- Category: JEDEC
$54.00
$27.00
A revised method for determining the effects of bias conditions and temperature, over time, on solid state devices is now available. Revision B of A108 includes low temperature operating life (LTOL) and high temperature gate bias (HTGB) stress conditions, revised cool down requirements for high temperature stress, and a procedure to follow if parts are not tested within the allowed time window.
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