• JEDEC EIA 397-1

JEDEC EIA 397-1

  • ADDENDUM No. 1 TO EIA-397
  • Amendment by JEDEC Solid State Technology Association, 07/01/198
  • Category: JEDEC

$106.00 $53.00

A compilation of 12 new or revised thyristor test methods which have been adopted since the original standard was issued in 1972.
PDF

All of our standards document are available in PDF (Portable Document Format), an electronic, downloadable format.You will be able to download the file in your account downloads.

Multi-User Access

After purchasing, you have the ability to assign each license to a specific user.

Printable

At any time, you are permitted to make printed copies for your and your members' reference use.

JEDEC JESD307 (R2002)

JEDEC JESD307 (R2002)

VOLTAGE REGULATOR DIODE NOISE VOLTAGE MEASUREMENT..

$24.00 $48.00

JEDEC EIA 323 (R2002)

JEDEC EIA 323 (R2002)

AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES..

$26.00 $51.00

JEDEC JESD6 (R2002)

JEDEC JESD6 (R2002)

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE..

$30.00 $59.00

JEDEC JESD340 (R2009)

JEDEC JESD340 (R2009)

STANDARD FOR THE MEASUREMENT OF CRE..

$27.00 $54.00