IEEE 759-1984
- IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
- standard by IEEE, 12/15/1984
- Category: IEEE
$132.00
$66.00
New IEEE Standard - Inactive-Withdrawn.Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.
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