IEEE 641-1987
- IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays
- standard by IEEE, 10/07/1988
- Category: IEEE
$102.00
$51.00
New IEEE Standard - Inactive-Withdrawn.This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.
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