IEEE 592-2007
- IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors
- standard by IEEE, 05/08/2008
- Category: IEEE
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Revision Standard - Superseded.Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.
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