IEEE 1687-2014
- IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
- standard by IEEE, 12/05/2014
- Category: IEEE
$264.00
$132.00
New IEEE Standard - Active.A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to describe this network, and a software language and protocol for communicating with the instruments via this network.
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