• IEEE 1620-2008

IEEE 1620-2008

  • IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
  • standard by IEEE, 12/05/2008
  • Category: IEEE

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Revision Standard - Active.This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.
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