• IEEE 1500-2005

IEEE 1500-2005

  • IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
  • standard by IEEE, 08/29/2005
  • Category: IEEE

$148.00 $74.00

New IEEE Standard - Active.This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to facilitate communication between core designers and core integrators.
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NECA 420-2014

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NECA 402-2014

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